
Applied Rigaku Technologies, Inc.
Benchtop & Process Solutions
Silicone Coat Weight Analysis
9825 Spectrum Drive, Bldg 4, Suite 475
US-78717 Austin, Texas
Tel:
+1 512-225-1796
Mail:
Company description
Benchtop & Process Solutions for Silicone Coat Weight
Applied Rigaku Technologies, Inc., a division of Rigaku Corporation, engineers, manufactures and distributes Rigaku EDXRF products worldwide. Located in Austin, Texas, USA, our company specializes in benchtop and process EDXRF spectrometers. Our products serve web applications with the ability to perform real-time or at-line silicone coat weight analysis.
In-line, Real-time Si Coat Weight Profiling
For in-line process control needs, we offer the NEX LS linear scanner for cross and machine direction Si coat weight profiling of your process. To maintain consistent quality, improve efficiency, and minimize cost, the NEX LS is engineered to solve the challenges found in coating and converting processes. The intuitive design allows users to self-install and customize the system to meet their process needs.
Benchtop EDXRF for Si Coat Weight Analysis
For rapid and accurate at-line solutions, the NEX QC Series benchtop EDXRF analyzers enable the measurement of very low silicone coating weights and metal catalysts in silicone coatings, all with one instrument. Challenging applications that were either marginal or not possible with earlier technologies are now a reality. As premium, cost-effective EDXRF spectrometers, the NEX QC Series deliver superior performance with an easy-to-learn software interface in a robust package specially designed for today’s silicone coating industry.
Applied Rigaku Technologies, Inc., a division of Rigaku Corporation, engineers, manufactures and distributes Rigaku EDXRF products worldwide. Located in Austin, Texas, USA, our company specializes in benchtop and process EDXRF spectrometers. Our products serve web applications with the ability to perform real-time or at-line silicone coat weight analysis.
- Total solution for silicone release coaters
- Silicone analysis on paper, clay-coated paper, and thin-film release liners
- Proprietary silicone on clay-coated paper algorithms
- Converters – silicone on plastic or paper
- Silicone as a moisture barrier on thin films
- Vacuum formed plastics – denesting silicone coatings
- Specialty plastics
In-line, Real-time Si Coat Weight Profiling
For in-line process control needs, we offer the NEX LS linear scanner for cross and machine direction Si coat weight profiling of your process. To maintain consistent quality, improve efficiency, and minimize cost, the NEX LS is engineered to solve the challenges found in coating and converting processes. The intuitive design allows users to self-install and customize the system to meet their process needs.
Benchtop EDXRF for Si Coat Weight Analysis
For rapid and accurate at-line solutions, the NEX QC Series benchtop EDXRF analyzers enable the measurement of very low silicone coating weights and metal catalysts in silicone coatings, all with one instrument. Challenging applications that were either marginal or not possible with earlier technologies are now a reality. As premium, cost-effective EDXRF spectrometers, the NEX QC Series deliver superior performance with an easy-to-learn software interface in a robust package specially designed for today’s silicone coating industry.
Contact person
Applied Rigaku Technologies, Inc.:
Robert Bartek
President & CEO
Tel. +1 512-225-1796